Sheng-Bai Zhu : rechercher sur Z-Library

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1

Molecular-dynamics computer simulation of an aqueous NaCl solution: Structure

Zhu, Sheng-Bai, Robinson, G. Wilse

Journal:

The Journal of Chemical Physics

Année:

1992

Langue:

english

Fichier:

PDF, 1.28 MB

english, 1992

2

Method for determination of co-spectral gain and absorption coefficients in high-power lasers

Shao-Chi Lin, Sheng-Bai Zhu, Qi-Hong Lou, Qi-Sheng He

Journal:

Journal of Quantitative Spectroscopy and Radiative Transfer

Année:

1984

Langue:

english

Fichier:

PDF, 1003 KB

english, 1984

3

Attachment kinetics and life time of perionization electrons in rate-gas halogen laser mixtures

Shao-Chi Lin, Cheng-En Zheng, Dennis Lo, J. Matsumoto, Sheng-Bai Zhu

Journal:

Applied Physics B: Lasers and Optics

Année:

1986

Langue:

english

Fichier:

PDF, 895 KB

english, 1986

4

Interactions of water, ions, and atoms with metal surfaces

Journal:

Surface Science

Année:

1995

Langue:

english

Fichier:

PDF, 825 KB

english, 1995

5

Molecular dynamics simulation of adsorption in electric double layers

Michael R. Philpott, James N. Glosli, Sheng-Bai Zhu

Journal:

Surface Science

Année:

1995

Langue:

english

Fichier:

PDF, 727 KB

english, 1995

6

Hydrophobic effects on adsorption of solutes onto surfaces

Journal:

Computational Materials Science

Année:

1995

Langue:

english

Fichier:

PDF, 607 KB

english, 1995

7

[IEEE 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings - Cambridge, MA, USA (10-12 Sept. 1997)] 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings - Molecular contamination on silicon wafers: a theoretical study

Année:

1997

Langue:

english

Fichier:

PDF, 290 KB

english, 1997

8

A new flexible/polarizable water model

Zhu, Sheng-Bai, Singh, Surjit, Robinson, G. Wilse

Journal:

The Journal of Chemical Physics

Année:

1991

Langue:

english

Fichier:

PDF, 992 KB

english, 1991

9

[IEEE 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing. ASMC 2002 - Boston, MA, USA (30 April-2 May 2002)] 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing. ASMC 2002 (Cat. No.02CH37259) - Study of airborne molecular contamination in minienvironments

Année:

2002

Langue:

english

Fichier:

PDF, 270 KB

english, 2002

10

Sensitivity analysis of distribution functions of liquid water

Zhu, Sheng-Bai, Wong, Chung F.

Journal:

The Journal of Chemical Physics

Année:

1993

Langue:

english

Fichier:

PDF, 755 KB

english, 1993

11

Interaction of water with metal surfaces

Zhu, Sheng-Bai, Philpott, Michael R.

Journal:

The Journal of Chemical Physics

Année:

1994

Langue:

english

Fichier:

PDF, 850 KB

english, 1994

12

Sensitivity analysis of water thermodynamics

Zhu, Sheng-Bai, Wong, Chung F.

Journal:

The Journal of Chemical Physics

Année:

1993

Langue:

english

Fichier:

PDF, 939 KB

english, 1993

13

Sensitivity Analysis of a Polarizable Water Model

Zhu, Sheng-Bai, Wong, Chung F.

Journal:

Journal of Physical Chemistry

Année:

1994

Langue:

english

Fichier:

PDF, 772 KB

english, 1994

14

SPIE Proceedings [SPIE 26th Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 25 February 2001)] Metrology, Inspection, and Process Control for Microlithography XV - Application of SMIF isolation to lithography processes for contamination control

Zhu, Sheng-Bai, Sullivan, Neal T.

Année:

2001

Langue:

english

Fichier:

PDF, 260 KB

english, 2001

15

SPIE Proceedings [SPIE Photomask and X-Ray Mask Technology VI - Yokohama, Japan (Tuesday 13 April 1999)] Photomask and X-Ray Mask Technology VI - Shipping, handling, and storage of reticles

Zhu, Sheng-Bai, Martin, Ray, Morimoto, Hiroaki

Année:

1999

Langue:

english

Fichier:

PDF, 260 KB

english, 1999

16

SPIE Proceedings [SPIE Microlithography 2000 - Santa Clara, CA (Sunday 27 February 2000)] Metrology, Inspection, and Process Control for Microlithography XIV - Contamination control during shipping, handling, and storage of reticles

Zhu, Sheng-Bai, Sullivan, Neal T.

Année:

2000

Langue:

english

Fichier:

PDF, 653 KB

english, 2000

17

SPIE Proceedings [SPIE Microlithography 2003 - Santa Clara, CA (Sunday 23 February 2003)] Metrology, Inspection, and Process Control for Microlithography XVII - Protecting reticles from contamination using SMIF technologies

Zhu, Sheng-Bai, Herr, Daniel J.

Année:

2003

Langue:

english

Fichier:

PDF, 146 KB

english, 2003

18

Molecular Dynamics Study of an Aqueous LiF Solution

Zhu, Sheng-Bai, Wilse Robinson, G.

Journal:

Zeitschrift für Naturforschung A

Année:

1991

Langue:

english

Fichier:

PDF, 6.45 MB

english, 1991